A comparison study of scratch and wear properties using atomic force microscopyTSENG, Ampere A.Applied surface science. 2010, Vol 256, Num 13, pp 4246-4252, issn 0169-4332, 7 p.Article

Recent developments in micromilling using focused ion beam technologyTSENG, Ampere A.Journal of micromechanics and microengineering (Print). 2004, Vol 14, Num 4, pp R15-R34, issn 0960-1317Article

Recent developments in nanofabrication using scanning near-field optical microscope lithographyTSENG, Ampere A.Optics and laser technology. 2007, Vol 39, Num 3, pp 514-526, issn 0030-3992, 13 p.Article

Assessments of technology transfer activities of US universities and associated impact of Bayh-Dole ActTSENG, Ampere A; RAUDENSKY, Miroslav.Scientometrics (Print). 2014, Vol 101, Num 3, pp 1851-1869, issn 0138-9130, 19 p.Article

Mechanical strength and interface characteristics of transmission laser bondingTSENG, Ampere A; PARK, Jong-Seung.IEEE transactions on electronics packaging manufacturing. 2006, Vol 29, Num 3, pp 191-201, issn 1521-334X, 11 p.Article

Laser-based internal profile measurement systemTSENG, Ampere A; TANAKA, Masahito; LEELADHARAN, Bharath et al.Automation in construction. 2002, Vol 11, Num 6, pp 667-679, issn 0926-5805Article

Ablation of transparent materials using excimer lasers for photonic applicationsCHEN, Ying-Tung; NAESSENS, Kris; BAETS, Roel et al.Optical review. 2005, Vol 12, Num 6, pp 427-441, issn 1340-6000, 15 p.Article

Scratch direction and threshold force in nanoscale scratching using atomic force microscopesTSENG, Ampere A; JEFFREY KUO, Chung-Feng; JOU, Shyankay et al.Applied surface science. 2011, Vol 257, Num 22, pp 9243-9250, issn 0169-4332, 8 p.Article

Electron beam lithography in nanoscale fabrication: Recent developmentTSENG, Ampere A; KUAN CHEN; CHEN, Chii D et al.IEEE transactions on electronics packaging manufacturing. 2003, Vol 26, Num 2, pp 141-149, issn 1521-334X, 9 p.Article

Spray cooling by solid jet nozzles using alumina/water nanofluidsBELLEROVA, Hana; TSENG, Ampere A; POHANKA, Michal et al.International journal of thermal sciences. 2012, Vol 62, pp 127-137, issn 1290-0729, 11 p.Article

Influence of Si-nanocrystal distribution in the oxide on the charging behavior of MOS structuresLIU, Y; CHEN, T. P; NG, C. Y et al.I.E.E.E. transactions on electron devices. 2006, Vol 53, Num 4, pp 914-917, issn 0018-9383, 4 p.Article

Recent developments on microablation of glass materials using excimer lasersTSENG, Ampere A; CHEN, Ying-Tung; CHAO, Choung-Lii et al.Optics and lasers in engineering. 2007, Vol 45, Num 10, pp 975-992, issn 0143-8166, 18 p.Article

Relationship Between Current Transport and Electroluminescence in Si⁺-Implanted ^Si02 ^Thin FilmsLIANG DING; CHEN, T. P; MING YANG et al.I.E.E.E. transactions on electron devices. 2009, Vol 56, Num 11, pp 2785-2791, issn 0018-9383, 7 p.Article